Influence of annealing on structure of Nylon 11


Autoria(s): Zhang QZ; Mo ZS; Liu SY; Zhang HF
Data(s)

2000

Resumo

Differential scanning calorimeter (DSC), wide-angle X-ray diffraction (WAXD), small-angle X-ray scattering (SAXS), and density techniques have been used to investigate the structural parameters of the solid state of Nylon 11 annealed at different temperatures. The equilibrium heat of fusion Delta H-m(0) and equilibrium melting temperature T-m(0) were estimated to be 189.05 J g(-1) and 202.85 degrees C respectively by using the Hoffman-Weeks approach. The degree of crystallinity (W-c,W-x) ranged approximately 24-42% was calculated by WAXD and compared with those by calorimetry (W-c,W-h) and density (W-c,W-d) measurements. The radius of gyration R-g, crystalline thickness L-c, noncrystalline thickness L-a, long period L, semiaxes of the particles (a, b), electron-density difference between the crystalline and noncrystalline regions eta(c) - eta(a), and the invariant Q increased with increasing annealing temperature. The analysis of the SAXS data was based upon the particle characteristic function and the one-dimensional electron-density correlation function. An interphase region existed between the crystalline and noncrystalline region with a clear dimension of about 2 nm for semicrystalline Nylon 11. Instead of the traditional two-phase model, a three-phase model has been proposed to explain these results by means of SAXS.

Identificador

http://202.98.16.49/handle/322003/19645

http://www.irgrid.ac.cn/handle/1471x/154557

Idioma(s)

英语

Fonte

Zhang QZ;Mo ZS;Liu SY;Zhang HF.Influence of annealing on structure of Nylon 11,MACROMOLECULES,2000,33(16):5999-6005

Palavras-Chave #X-RAY-SCATTERING #CRYSTAL-STRUCTURE #INTERPHASE #POLYMERS
Tipo

期刊论文