Atomic force microscopy and surface-enhanced Raman scattering detection of DNA based on DNA-nanoparticle complexes


Autoria(s): Sun LL; Sun YJ; Xu FG; Zhang Y; Yang T; Guo CL; Liu ZL; Li Z
Data(s)

2009

Resumo

We report a simple method for the label-free detection of double-stranded DNA using surface-enhanced Raman scattering (SERS). We prepared cetyltrimethylammonium bromide (CTAB)-capped silver nanoparticles and a DNA-nanoparticle complex by adding silver nanoparticles to lambda-DNA solutions. In the present study, the utilization of CTAB-capped silver nanoparticles facilitates the electrostatic interaction between DNA molecules and silver nanoparticles; at the same time, the introduction of DNA avoids adding aggregating agent for the formation of nanoparticle aggregates to obtain large enhancement of DNA, because the DNA acts as both the probe molecules and aggregating agent of Ag nanoparticles.

Identificador

http://202.98.16.49/handle/322003/11437

http://www.irgrid.ac.cn/handle/1471x/147957

Idioma(s)

英语

Fonte

Sun LL;Sun YJ;Xu FG;Zhang Y;Yang T;Guo CL;Liu ZL;Li Z.Atomic force microscopy and surface-enhanced Raman scattering detection of DNA based on DNA-nanoparticle complexes,NANOTECHNOLOGY ,2009,20(12):文献编号:125502

Palavras-Chave #VIRUS TYPE-1 RNA #PCR ASSAY #SPECTROSCOPY #MOLECULES #PROBES #SERS #CATIONS #PLASMA #ACID
Tipo

期刊论文