Electroluminescence of hole block material caused by electron accumulation and hole penetration


Autoria(s): Zhou L; Zhang HJ; Deng RP; Guo ZY; Feng J; Li ZF
Data(s)

2008

Resumo

In this study, we investigated the electroluminescence (EL) mechanisms and processes of hole block material in the multilayer devices with Eu(TTA)(3)phen (TTA = thenoyltrifluoroacetone, phen = 1,10-phenanthroline) doped CBP (4,4'-N,N'-dicarbazolebiphenyl) as the light-emitting layer (EML). First, the hole block ability of 2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline (BCP) was experimentally confirmed by comparing the EL spectra. With increasing hole injection, BCP emission emerges and increases gradually due to the increasing hole penetration from EML into the hole block layer (HBL).

Identificador

http://ir.ciac.jl.cn/handle/322003/10099

http://www.irgrid.ac.cn/handle/1471x/147259

Idioma(s)

英语

Fonte

Zhou L;Zhang HJ;Deng RP;Guo ZY;Feng J;Li ZF.Electroluminescence of hole block material caused by electron accumulation and hole penetration,JOURNAL OF PHYSICAL CHEMISTRY C,2008,112(38):15065-15070

Palavras-Chave #LIGHT-EMITTING DEVICES #ORGANIC ELECTROPHOSPHORESCENCE #EUROPIUM COMPLEX #RECOMBINATION ZONE #TRANSIENT ANALYSIS #ENERGY-TRANSFER #DIODES #EFFICIENCY #EMISSION #MECHANISMS
Tipo

期刊论文