Electroluminescence of hole block material caused by electron accumulation and hole penetration
Data(s) |
2008
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Resumo |
In this study, we investigated the electroluminescence (EL) mechanisms and processes of hole block material in the multilayer devices with Eu(TTA)(3)phen (TTA = thenoyltrifluoroacetone, phen = 1,10-phenanthroline) doped CBP (4,4'-N,N'-dicarbazolebiphenyl) as the light-emitting layer (EML). First, the hole block ability of 2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline (BCP) was experimentally confirmed by comparing the EL spectra. With increasing hole injection, BCP emission emerges and increases gradually due to the increasing hole penetration from EML into the hole block layer (HBL). |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Zhou L;Zhang HJ;Deng RP;Guo ZY;Feng J;Li ZF.Electroluminescence of hole block material caused by electron accumulation and hole penetration,JOURNAL OF PHYSICAL CHEMISTRY C,2008,112(38):15065-15070 |
Palavras-Chave | #LIGHT-EMITTING DEVICES #ORGANIC ELECTROPHOSPHORESCENCE #EUROPIUM COMPLEX #RECOMBINATION ZONE #TRANSIENT ANALYSIS #ENERGY-TRANSFER #DIODES #EFFICIENCY #EMISSION #MECHANISMS |
Tipo |
期刊论文 |