automated test program generation for an industrial optimizing compiler
| Data(s) |
2009
|
|---|---|
| Resumo |
Association for Computing Machinery, ACM; IEEE; IEEE Computer Society; SIGSOFT |
| Identificador | |
| Publicador |
2009 ICSE WORKSHOP ON AUTOMATION OF SOFTWARE TEST 345 E 47TH ST, NEW YORK, NY 10017 USA |
| Fonte |
Zhao Chen;Xue Yunzhi;Tao Qiuming;Guo Liang;Wang Zhaohui.automated test program generation for an industrial optimizing compiler.见：2009 ICSE WORKSHOP ON AUTOMATION OF SOFTWARE TEST.Proceedings of the 2009 ICSE Workshop on Automation of Software Test, AST 2009,345 E 47TH ST, NEW YORK, NY 10017 USA,2009,36-43 |
| Palavras-Chave | #Chinese Academy of Sciences #Institute of Software #Matsushita Electric Industrial Co. #Ltd #automated test program generation #industrial optimizing compiler #script-driven test program generation process #temporal-logic model #automatic programming #optimising compilers #program testing #temporal logic |
| Tipo |
会议论文 |
