FT-IR study of the microstructure of Nafion® membrane

Autoria(s): 梁振兴; 陈维民; 刘建国; 王素力; 周振华; 李文震; 孙公权; 辛勤
Data(s)

2004
Identificador

http://159.226.238.44/handle/321008/82633

http://www.irgrid.ac.cn/handle/1471x/138169
Idioma(s)

英
Direitos

1;1
Fonte

梁振兴;陈维民;刘建国;王素力;周振华;李文震;孙公权;辛勤.FT-IR study of the microstructure of Nafion® membrane,Journal of Membrane Science,2004,233():39-44
Tipo

期刊论文
Acesso ao item digital