Laser crystallization of amorphous silicon films investigated by Raman spectroscopy and atomic force microscopy

Autoria(s): Jin Jing; Yuan Zhijun; Huang Lu; Chen Sheng; Shi Weimin; Cao Zechun; Lou Qihong
Data(s)

2011
Identificador

http://ir.siom.ac.cn/handle/181231/7252

http://www.irgrid.ac.cn/handle/1471x/135527
Idioma(s)

中文
Fonte

Jin Jing,Yuan Zhijun,Huang Lu,Chen Sheng,Shi Weimin,Cao Zechun,Lou Qihong.Laser crystallization of amorphous silicon films investigated by Raman spectroscopy and atomic force microscopy.APPLIED SURFACE SCIENCE,2011,256(11):3453
Palavras-Chave #光学材料 #3458
Tipo

期刊论文
Acesso ao item digital