Structural stability of C-60 films under the bombardment of 1.95 GeV Kr ions


Autoria(s): Yao, CF; Fu, YC; Jin, YF; Wang, ZG; Zang, H; Wei, KF; Gou, J; Ma, YZ; Shen, TL
Data(s)

2010

Resumo

The structural stability of C-60 films under the bombardment of 1.95 GeV Kr ions is investigated. The irradiated C-60 films were analyzed by Fourier Transform Infrared (FTIR) spectroscopy and Raman scattering technique. The analytical results indicate that the irradiation induced a decrease of icosahedral symmetry of C-60 molecule and damage of C-60 films; different vibration modes of C-60 molecule have different irradiation sensitivities; the mean efficient damage radius obtained from experimental data is about 1.47 nm, which is in good agreement with thermal spike model prediction.

Identificador

http://ir.impcas.ac.cn/handle/113462/8273

http://www.irgrid.ac.cn/handle/1471x/133213

Idioma(s)

英语

Fonte

Yao, CF; Fu, YC; Jin, YF; Wang, ZG; Zang, H; Wei, KF; Gou, J; Ma, YZ; Shen, TL.Structural stability of C-60 films under the bombardment of 1.95 GeV Kr ions,CHINESE SCIENCE BULLETIN,2010,55(31):3533-3537

Palavras-Chave #ONION-LIKE FULLERENES #SOLID C-60 #SUPERCONDUCTIVITY #POLYMERIZATION #IRRADIATION
Tipo

期刊论文