Studying the Attribution of LiF in OLED by the C-V Characteristics


Autoria(s): Zhang, CL; Wang, FC; Zhang, Y; Li, HX; Liu, S
Data(s)

2010

Resumo

The organic light-emitting device (OLED) with simple structures of indium tin oxide (ITO)/tris(8-quinolinolato) aluminum (Alq(3))/LiF/Al and ITO/Alq(3)/Al was fabricated to analyze the contribution of LiF in OLED. We used the C-V characteristics to investigate the contribution of LiF in OLED and found that the capacitance of the above-mentioned structures was 12.5 nF and 77.5 nF, respectively. It is shown that the LiF layer affects the property of OLED resulting in the change of the capacitance of the device.

Identificador

http://ir.impcas.ac.cn/handle/113462/8057

http://www.irgrid.ac.cn/handle/1471x/133105

Idioma(s)

英语

Fonte

Zhang, CL; Wang, FC; Zhang, Y; Li, HX; Liu, S.Studying the Attribution of LiF in OLED by the C-V Characteristics,INTERNATIONAL JOURNAL OF PHOTOENERGY,2010,():291931

Palavras-Chave #LIGHT-EMITTING-DIODES #ENHANCED ELECTRON INJECTION #ELECTROLUMINESCENCE DEVICES #EFFICIENCY #LAYER #CATHODES #MOBILITY #FILMS
Tipo

期刊论文