Single- and double-electron processes in collisions of Xe23+ ions with helium


Autoria(s): Ding, BW; Yu, DY; Ruan, FF; Lu, RC; Shao, CJ; Wan, CL; Chen, SW; Cai, XH
Data(s)

2010

Resumo

We report the measurements of relative cross sections for single capture (SC), double capture (DC), single ionization (SI), double ionization (DI), and transfer ionization (TI) in collisions of Xe23+ ions with helium atoms in the velocity range of 0.65-1.32 a.u. The relative cross sections show a weak velocity dependence. The cross-section ratio of double-(DE) to single-electron (SE) removal from He, sigma(DE)/sigma(SE), is about 0.45. Single capture is the dominant reaction channel which is followed by transfer ionization, while only very small probabilities are found for pure ionization and double capture. The present experimental data are in satisfactory agreement with the estimations by the extended classical over-barrier (ECB) model..

Identificador

http://ir.impcas.ac.cn/handle/113462/7915

http://www.irgrid.ac.cn/handle/1471x/133034

Idioma(s)

英语

Fonte

Ding, BW; Yu, DY; Ruan, FF; Lu, RC; Shao, CJ; Wan, CL; Chen, SW; Cai, XH.Single- and double-electron processes in collisions of Xe23+ ions with helium,PHYSICAL REVIEW A ,2010,82(3):32703

Palavras-Chave #HIGHLY-CHARGED IONS #TRANSFER EXCITATION #SLOW COLLISIONS #CROSS-SECTIONS #LOW-ENERGY #ATOMS #VELOCITY #CAPTURE #HE
Tipo

期刊论文