Study on DNA Damage Induced by Neon Beam Irradiation in Saccharomyces Cerevisiae


Autoria(s): Lu, D; Li, WJ; Wu, X; Wang, JF; Ma, SA; Liu, QF; He, JY; Jing, XG; Ding, N; Dai, ZY; Zhou, JP
Data(s)

2010

Resumo

Yeast strain Saccharornyces cerevisiae was irradiated with different doses of 85 MeV/u Ne-20(10+) to investigate DNA damage induced by heavy ion beam in eukaryotic microorganism. The survival rate, DNA double strand breaks (DSBs) and DNA polymorphic were tested after irradiation. The results showed that there were substantial differences in DNA between the control and irradiated samples. At the dose of 40 Cy, the yeast cell survival rate approached 50%, DNA double-strand breaks were barely detectable, and significant DNA polymorphism was observed. The alcohol dehydrogenase II gene was amplified and sequenced. It was observed that base changes in the mutant were mainly transversions of T-->G and T-->C. It can be concluded that heavy ion beam irradiation can lead to change in single gene and may be an effective way to induce mutation.

Identificador

http://ir.impcas.ac.cn/handle/113462/7777

http://www.irgrid.ac.cn/handle/1471x/132965

Idioma(s)

英语

Fonte

Lu, D; Li, WJ; Wu, X; Wang, JF; Ma, SA; Liu, QF; He, JY; Jing, XG; Ding, N; Dai, ZY; Zhou, JP.Study on DNA Damage Induced by Neon Beam Irradiation in Saccharomyces Cerevisiae,PLASMA SCIENCE & TECHNOLOGY,2010,12(6):753-756

Palavras-Chave #RAPD ASSAY #MUTATIONS #IONS #DIVERSITY #PFGE
Tipo

期刊论文