Multi-electron processes in C-13(6+) ions with neon collisions in energy region 4.15-11.08 keV/u
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3871
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Resumo |
The cross-section ratios of double-, triple-, quadruple-, and the total multi-electron processes to the single electron capture process sigma(DE)/sigma(SC), sigma(TE)/sigma(SC), sigma(QE)/sigma(SC) and sigma(ME)/sigma(SC)) as well as the relative ratios among reaction channels in double-electron active, triple-electron active and quadruple- electron active are measured in C-13(6+) -Ne collision in the energy region of 4.15-11.08 keV/u by employing position-sensitive and time-of-flight coincident techniques. It is determined that the cross-section ratios sigma(DE)/sigma(SC), sigma(TE)/sigma(SC), sigma(QE)/sigma(SC) and sigma(ME)/sigma(SC) are approximately the constants of 0.20 +/- 0.03, 0.16 +/- 0.04, 0.06 +/- 0.02 and 0.42 +/- 0.05. These values are obviously smaller than the predictions of the molecular Coulomb over-the-barrier model (MCBM) [J. Phys. B 23 (1990) 4293], the extended classical over-the-barrier model (ECBM) [J. Phys. B 19 (1986) 2925] and the semiempirical scaling laws (SL) [Phys. Rev. A 54 (1996) 4127]. However, the relative ratios among partial processes of DE, TE and QE are found to depend on collision energy, which suggests that the collision dynamics depends on the collision velocity. The limitation of velocity-independent character of ECBM, MCBM and SL is undoubtedly shown. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Ruan, FF; Cai, XH; Yu, DY; Lu, RC; Shao, CJ; Lu, J; Cui, Y; Shao, JX; Xu, X; Zhang, HQ; Ding, BW; Yang, ZH; Chen, XM.Multi-electron processes in C-13(6+) ions with neon collisions in energy region 4.15-11.08 keV/u,CHINESE PHYSICS LETTERS ,38718,23(1):95-98 |
Palavras-Chave | #MULTIPLE-ELECTRON-CAPTURE #HIGHLY-CHARGED IONS #CROSS-SECTIONS #SLOW COLLISIONS #TRANSFER IONIZATION #LOW-VELOCITY #HE #HELIUM #PROJECTILES #SINGLE |
Tipo |
期刊论文 |