Double electron processes in collisions of partially stripped ions Cq+ (q=1-4) with helium
| Data(s) |
3908
|
|---|---|
| Resumo |
The multi-electron processes are investigated for 17.9-120keV/u C1+, 30-323 keV/u C2+, 120-438 keV/u C3+, 287-480keV/u C4+ incident on a helium target. The cross-section ratios of double electron (DE) process to the total of the single electron (SE) and the double electron process (i.e. SE+DE), the direct double electron (DDI) to the direct single ionization (DSI) as well as the contributions of DDI to DE and of TI to DE are measured using coincidence techniques. The energy and charge state dependences of the measured cross-section ratios are studied and discussed. |
| Identificador | |
| Idioma(s) |
英语 |
| Fonte |
Ding, BW (Ding Bao-Wei); Chen, XM (Chen Xi-Meng); Yu, DY (Yu De-Yang); Fu, HB (Fu Hong-Bin); Liu, ZY (Liu Zhao-Yuan); Sun, GZ (Sun Guang-Zhi); Liu, YW (Liu Yu-Wen); Lu, YX (Lu Yan-Xia); Xie, JS (Xie Jiang-Shan); Du, J (Du Juan); Gao, ZM (Gao Zhi-Min); Chen, L (Chen Lin); Cui, Y (Cui Ying); Shao, JX (Shao Jian-Xiong); He, ZF (He Zi-Feng); Cai, XH (Cai Xiao-Hong).Double electron processes in collisions of partially stripped ions Cq+ (q=1-4) with helium,CHINESE PHYSICS LETTERS ,39083,24(1):94-96 |
| Palavras-Chave | #DOUBLE-IONIZATION #TARGET IONIZATION #CAPTURE #SINGLE |
| Tipo |
期刊论文 |
