X-ray emission of hollow atoms formed by highly charged argon and xenon ions below a beryllium surface


Autoria(s): Zhao, YT (Zhao, Yongtao); Xiao, GQ (Xiao, Guoqing); Zhang, XA (Zhang, Xiaoan); Yang, ZH (Yang, Zhihu); Zhang, YP (Zhang, Yanping); Zhan, WL (Zhan, Wenlong); Chen, XM (Chen, Ximeng); Li, FL (Li, Fuli)
Data(s)

3920

Resumo

The X-ray emission induced by highly charged argon and xenon ions impinging on a beryllium surface is investigated. It is found that spectra of the X-ray induced by Ar-17,Ar-18+ interacting with the surface are very different from those of the X-ray induced by Ar-17,Ar-18+ interacting with residual gases. The result provides an experimental evidence for the existence of hollow atoms below the surface. Several unexpected X-ray lines are also found in the experiment. Firstly, K X-rays are observed when Ar16+ ions which initially have no K shell holes interact with the surface. Secondly, if there are more than 2 M shell vacancies at the initial time, strong M alpha alpha two-electron-one-photon (TEOP) transitions are found in the collisions of Xe-28+,Xe-29+,Xe-30+ ions with the surface.

Identificador

http://ir.impcas.ac.cn/handle/113462/5975

http://www.irgrid.ac.cn/handle/1471x/132674

Idioma(s)

英语

Fonte

Zhao, YT (Zhao, Yongtao); Xiao, GQ (Xiao, Guoqing); Zhang, XA (Zhang, Xiaoan); Yang, ZH (Yang, Zhihu); Zhang, YP (Zhang, Yanping); Zhan, WL (Zhan, Wenlong); Chen, XM (Chen, Ximeng); Li, FL (Li, Fuli) .X-ray emission of hollow atoms formed by highly charged argon and xenon ions below a beryllium surface, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS ,39203,258(1):121-124

Palavras-Chave #highly charged ion (HCI) #hollow atom (HA) #X-rays #direct recombination (DR) #TEOP transitions
Tipo

期刊论文