Structural and PL properties of Cu-doped ZnO films


Autoria(s): Peng, XP (Peng, Xingping); Xu, JZ (Xu, Jinzhang); Zang, H (Zang, Hang); Wang, BY (Wang, Boyu); Wang, ZG (Wang, Zhiguang)
Data(s)

3950

Resumo

Cu-doped ZnO films with hexagonal wurtzite structure were deposited on silicon (1 1 1) substrates by radio frequency (RF) sputtering technique. An ultraviolet (UV) peak at similar to 380nm and a blue band centered at similar to 430nm were observed in the room temperature photoluminescent (PL) spectra. The UV emission peak was from the exciton transition. The blue emission band was assigned to the Zn interstitial (Zn-i) and Zn vacancy (V-Zn) level transition. A strong blue peak (similar to 435 nm) was observed in the PL spectra when the alpha(Cu) (the area ratio of Cu-chips to the Zn target) was 1.5% at 100 W, and ZnO films had c-axis preferred orientation and smaller lattice mismatch. The influence of alpha(Cu) and the sputtering power on the blue band was investigated.

Identificador

http://ir.impcas.ac.cn/handle/113462/5823

http://www.irgrid.ac.cn/handle/1471x/132598

Idioma(s)

英语

Fonte

Peng, XP (Peng, Xingping); Xu, JZ (Xu, Jinzhang); Zang, H (Zang, Hang); Wang, BY (Wang, Boyu); Wang, ZG (Wang, Zhiguang).Structural and PL properties of Cu-doped ZnO films ,JOURNAL OF LUMINESCENCE,39508,128(3):297-300

Palavras-Chave #ZnO films #Cu-doped #XRD #photoluminescence #RF sputtering
Tipo

期刊论文