High negative ion production yield in 30 keV F2+ + adenine (C5H5N5) collisions
| Data(s) |
2009
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|---|---|
| Resumo |
In collisions between slow F2+ ions (30 keV) and molecular targets, adenine, scattered particle production yields have been measured directly by simultaneous detection of neutrals, positive and negative ions. The relative cross-section for a negative ion formation channel was measured to be 1%. Despite a slight decrease compared to a larger target, the fullerene C-60, the measured negative ion formation cross section is still at least one order of magnitude larger than the yield in ion-atom interactions. International Collaboration Convention CNRS in France Ndegrees21657 National nature Science Foundation of China Ndegrees10434100 Ndegrees10504037 K. C. Wong Education Foundation, Hong Kong |
| Identificador | |
| Idioma(s) |
英语 |
| Fonte |
Li, B (Li, B.); Ma, X (Ma, X.); Zhu, XL (Zhu, X. L.); Zhang, SF (Zhang, S. F.); Liu, HP (Liu, H. P.); Feng, WT (Feng, W. T.); Qian, DB (Qian, D. B.); Zhang, DC (Zhang, D. C.); Chen, L (Chen, L.); Bredy, R (Bredy, R.); Montagne, G (Montagne, G.); Bernard, J (Bernard, J.); Martin, S (Martin, S.) .High negative ion production yield in 30 keV F2+ + adenine (C5H5N5) collisions,JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS ,2009,42(7 ):075204 |
| Palavras-Chave | #MICROCHANNEL-PLATE DETECTOR #COLLISIONS #FRAGMENTATION #LIF(100) #ATOMS |
| Tipo |
期刊论文 |
