Modification of Fe/Cu Multilayers under 2-MeV Xe20+ Irradiation
Data(s) |
2009
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Resumo |
Multilayers with a structure of Si/[Fe(10 nm)/CU(10 nm)](5) were deposited on Si(100) substrates and then irradiated at room temperature by using 2-MeV Xe20+. The modifications of the multilayers were characterized using a depth profile analysis of the Auger electron spectroscopy (AES) data and the evolution of crystallite structures of the multilayers were analyzed by using X-ray diffraction (XRD). The AES depth profiles indicated that de-mixing of the Fe and the Cu layers was observed at low ion fluences, but inter-mixing of the Fe and the Cu layers was found at high ion fluences and destroyed the layered structure of the multilayers. The obtained XRD patterns showed that, after irradiation by 2-MeV Xe20+ at; 2 x 10(16) ions/cm(2), the peaks of the multilayers related to a Cu-based fee solid solution and an Fe-based bee solid solution phase became visible, which implied that the inter-mixing at the Fe/Cu interface resulted in the formation of new phases. A possible mechanism of modification in the Fe/Cu multilayers induced by ion irradiation is briefly discussed. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Wei, KF (Wei, Kong-Fang); Wang, ZG (Wang, Zhi-Guang); Gou, J (Gou, Jie); Sheng, YB (Sheng, Yan-Bin); Jin, GM (Jin, Gen-Ming); Zang, H (Zang, Hang); Yao, CF (Yao, Cun-Feng); Ma, YZ (Ma, Yi-Zhun); Shen, TL (Shen, Tie-Long) . Modification of Fe/Cu Multilayers under 2-MeV Xe20+ Irradiation,JOURNAL OF THE KOREAN PHYSICAL SOCIETY,2009,55(6):2697-2700 |
Palavras-Chave | #Fe/Cu multilayers #Ion irradiation #Inter-mixing #De-mixing #AES #XRD |
Tipo |
期刊论文 |