Structural stability of C-60 films under the bombardment of 1.95 GeV Kr ions

Autoria(s): C.F. Yao; Y.C. Fu; Y.F. Jin; Z.G. Wang; H. Zang; K.F. Wei; J. Gou; Y.Z. Ma; T.L. Shen
Data(s)

2010
Identificador

http://210.72.146.199/handle/361006/2015

http://www.irgrid.ac.cn/handle/1471x/131975
Idioma(s)

英语
Fonte

C.F. Yao,Y.C. Fu,Y.F. Jin,Z.G. Wang,H. Zang,K.F. Wei,J. Gou,Y.Z. Ma,T.L. Shen.Structural stability of C-60 films under the bombardment of 1.95 GeV Kr ions.CHINESE SCIENCE BULLETIN,2010,55(31):3533-3537
Palavras-Chave #1.95 GeV Kr ions #C60 films #structural stability #efficient damage radius #thermal spike model
Tipo

期刊论文
Acesso ao item digital