Emittance measurement of highly charged ion beams extracted from ECR ion source using electric sweep scanner

Autoria(s): CaoY; MaL; ZhaoHW; ZhangZM; SunLT; LiJY; FengYC; LiXX
Data(s)

2004
Identificador

http://ir.impcas.ac.cn/handle/113462/1689

http://www.irgrid.ac.cn/handle/1471x/127978
Fonte

CaoY；MaL；ZhaoHW；ZhangZM；SunLT；LiJY；FengYC；LiXX.Emittance measurement of highly charged ion beams extracted from ECR ion source using electric sweep scanner,HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2004,28(8):885-888
Palavras-Chave #electric sweep scanner #ECR ion source #emittance
Tipo

期刊论文
Acesso ao item digital