Experimental studies of single-event effects induced by heavy ions

Autoria(s): LiuJ; HouMD; LiBQ; LiuCL; WangZG; ChengS; SunYM; JinYF; LinYL; CaiJR; WangSJ; YeZH; ZhuGW; DuH; RenQY; WuW; MaoXM; SunYQ; GuoR
Data(s)

2000
Identificador

http://ir.impcas.ac.cn/handle/113462/1317

http://www.irgrid.ac.cn/handle/1471x/127768
Fonte

LiuJ；HouMD；LiBQ；LiuCL；WangZG；ChengS；SunYM；JinYF；LinYL；CaiJR；WangSJ；YeZH；ZhuGW；DuH；RenQY；WuW；MaoXM；SunYQ；GuoR.Experimental studies of single-event effects induced by heavy ions,NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2000,164(5):973-978
Palavras-Chave #single-event effect #heavy ion simulation #microcircuit
Tipo

期刊论文
Acesso ao item digital