Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation

Autoria(s): Li ZH(李志宏); Gong YJ(巩雁军); Pu M(蒲敏); Wu D(吴东); Sun YH(孙予罕); Wang J(王军); Liu Y(柳义); Dong BZ(董宝中)
Data(s)

2001
Identificador

http://ir.sxicc.ac.cn/handle/0/814

http://www.irgrid.ac.cn/handle/1471x/121406
Idioma(s)

英语
Fonte

李志宏,巩雁军,蒲敏,吴东,孙予罕,王军,柳义,董宝中.Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation.Journal of Physics D: Applied Physics,2001,34(14):2085-2088
Tipo

期刊论文
Acesso ao item digital