Fractional overage of defects in self-assembled thiol monolayers on gold

Autoria(s): Diao P(刁鹏); Min Guo; Dianlu Jiang; Zhenbin Jia; Cui XL(崔晓莉); Gu DP(顾登平); Tong RT(童汝亭); Zhong B(钟炳)
Data(s)

2000
Identificador

http://ir.sxicc.ac.cn/handle/0/761

http://www.irgrid.ac.cn/handle/1471x/121314
Idioma(s)

中文
Fonte

刁鹏,Min Guo,Dianlu Jiang,Zhenbin Jia,崔晓莉,顾登平,童汝亭,钟炳.Fractional overage of defects in self-assembled thiol monolayers on gold.Journal of Electroanalytical Chemistry ,2000,480(1-2):59-63
Tipo

期刊论文
Acesso ao item digital