Detection of indium segregation effects in InGaAs/GaAs quantum wells using reflectance-difference spectrometry
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2002
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Resumo |
The influence of the Indium segregation on the interface asymmetry in InGaAs/GaAs quantum wells have been studied by reflectance-difference spectroscopy (RDS). It is found that the anisotropy of the 2H1E (2HH --> 1E) transition is very sensitive to the degree of the interface asymmetry. Calculations taking into account indium segregation yield good agreement with the observed anisotropy structures. It demonstrates that the anisotropy intensity ratio of the 1L1E (1LH --> 1E) and 2H1E transitions measured by RDS can be used to characterize the interface asymmetry. (C) 2002 Elsevier Science B.V. All rights reserved. The influence of the Indium segregation on the interface asymmetry in InGaAs/GaAs quantum wells have been studied by reflectance-difference spectroscopy (RDS). It is found that the anisotropy of the 2H1E (2HH --> 1E) transition is very sensitive to the degree of the interface asymmetry. Calculations taking into account indium segregation yield good agreement with the observed anisotropy structures. It demonstrates that the anisotropy intensity ratio of the 1L1E (1LH --> 1E) and 2H1E transitions measured by RDS can be used to characterize the interface asymmetry. (C) 2002 Elsevier Science B.V. All rights reserved. 于2010-11-15批量导入 zhangdi于2010-11-15 17:02:12导入数据到SEMI-IR的IR Made available in DSpace on 2010-11-15T09:02:12Z (GMT). No. of bitstreams: 1 2873.pdf: 129007 bytes, checksum: c7776daebc5d00cc80b51b44568e2180 (MD5) Previous issue date: 2002 Chinese Acad Sci, Inst Semicond, Lab Semicond Mat Sci, Beijing 100083, Peoples R China |
Identificador | |
Idioma(s) |
英语 |
Publicador |
ELSEVIER SCIENCE SA PO BOX 564, 1001 LAUSANNE, SWITZERLAND |
Fonte |
Ye XL; Chen YH; Xu B; Wang ZG .Detection of indium segregation effects in InGaAs/GaAs quantum wells using reflectance-difference spectrometry .见:ELSEVIER SCIENCE SA .MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 91,PO BOX 564, 1001 LAUSANNE, SWITZERLAND ,2002,62-65 |
Palavras-Chave | #半导体材料 #reflectance-difference spectroscopy #indium segregation #InGaAs/GaAs quantum wells #EPITAXY-GROWN INGAAS/GAAS #SURFACE SEGREGATION #INTERFACE |
Tipo |
会议论文 |