Effects and numerical analysis of argon gas flow on the oxygen concentration in Czochralski silicon single crystal growth


Autoria(s): Zhang ZC; Ren BY; Chen YH; Yang SY; Wang ZG
Data(s)

2003

Resumo

Argon gas, as a protective environment and carrier of latent heat, has an important effect on the temperature distribution in crystals and melts. Numeric simulation is a potent tool for solving engineering problems. In this paper, the relationship between argon gas flow and oxygen concentration in silicon crystals was studied systematically. A flowing stream of argon gas is described by numeric simulation for the first time. Therefore, the results of experiments can be explained, and the optimum argon flow with the lowest oxygen concentration can be achieved. (C) 2002 Elsevier Science B.V. All rights reserved.

Argon gas, as a protective environment and carrier of latent heat, has an important effect on the temperature distribution in crystals and melts. Numeric simulation is a potent tool for solving engineering problems. In this paper, the relationship between argon gas flow and oxygen concentration in silicon crystals was studied systematically. A flowing stream of argon gas is described by numeric simulation for the first time. Therefore, the results of experiments can be explained, and the optimum argon flow with the lowest oxygen concentration can be achieved. (C) 2002 Elsevier Science B.V. All rights reserved.

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Chinese Mat Res Soc.; Int Union Mat Res Soc.

Chinese Acad Sci, Inst Semicond, Lab Semicond Mat Sci, Beijing 100083, Peoples R China; Hebei Univ Technol, Inst Semicond, Tianjin 300130, Peoples R China

Chinese Mat Res Soc.; Int Union Mat Res Soc.

Identificador

http://ir.semi.ac.cn/handle/172111/14853

http://www.irgrid.ac.cn/handle/1471x/105144

Idioma(s)

英语

Publicador

ELSEVIER SCIENCE BV

PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS

Fonte

Zhang ZC; Ren BY; Chen YH; Yang SY; Wang ZG .Effects and numerical analysis of argon gas flow on the oxygen concentration in Czochralski silicon single crystal growth .见:ELSEVIER SCIENCE BV .MICROELECTRONIC ENGINEERING, 66 (1-4),PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS ,2003,504-509

Palavras-Chave #半导体材料 #Czochralski method #growth from melt #semiconductor silicon #argon gas flow #computer simulation #oxygen content #FURNACE PRESSURE
Tipo

会议论文