High quality hydrogenated amorphous silicon films with significantly improved stability
Data(s) |
1999
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Resumo |
High quality hydrogenated amorphous silicon (a-Si:H) films have been prepared by a simple "uninterrupted growth/annealing" plasma enhanced chemical vapor deposition (PECVD) technique, combined with a subtle boron-compensated doping. These a-Si:H films possess a high photosensitivity over 10(6), and exhibit no degradation in photoconductivity and a low light-induced defect density after prolonged illumination. The central idea is to control the growth conditions adjacent to the critical point of phase transition from amorphous to crystalline state, and yet to locate the Fermi level close to the midgap. Our results show that the improved stability and photosensitivity of a-Si:H films prepared by this method can be mainly attributed to the formation of a more robust network structure and reduction in the precursors density of light-induced metastable defects. High quality hydrogenated amorphous silicon (a-Si:H) films have been prepared by a simple "uninterrupted growth/annealing" plasma enhanced chemical vapor deposition (PECVD) technique, combined with a subtle boron-compensated doping. These a-Si:H films possess a high photosensitivity over 10(6), and exhibit no degradation in photoconductivity and a low light-induced defect density after prolonged illumination. The central idea is to control the growth conditions adjacent to the critical point of phase transition from amorphous to crystalline state, and yet to locate the Fermi level close to the midgap. Our results show that the improved stability and photosensitivity of a-Si:H films prepared by this method can be mainly attributed to the formation of a more robust network structure and reduction in the precursors density of light-induced metastable defects. 于2010-10-29批量导入 Made available in DSpace on 2010-10-29T06:37:06Z (GMT). No. of bitstreams: 1 2977.pdf: 400270 bytes, checksum: 72f05f23a08943ecad002dfd73a63447 (MD5) Previous issue date: 1999 Mat Res Soc.; Akzo Nobel.; dpiX A Xerox Co.; Fuji Elect Corp Res & Dev Ltd.; Kaneka Corp.; Mitsui Chem Co Ltd.; NAPS France.; Natl Renewable Energy Lab.; Sanyo Elect Co Ltd.; Tokuyama Corp.; Voltaix Inc. Chinese Acad Sci, State Lab Surface Phys, Inst Semicond, Beijing 100083, Peoples R China Mat Res Soc.; Akzo Nobel.; dpiX A Xerox Co.; Fuji Elect Corp Res & Dev Ltd.; Kaneka Corp.; Mitsui Chem Co Ltd.; NAPS France.; Natl Renewable Energy Lab.; Sanyo Elect Co Ltd.; Tokuyama Corp.; Voltaix Inc. |
Identificador | |
Idioma(s) |
英语 |
Publicador |
MATERIALS RESEARCH SOCIETY 506 KEYSTONE DRIVE, WARRENDALE, PA 15088-7563 USA |
Fonte |
Sheng SR; Liao XB; Ma ZX; Yue GZ; Wang YQ; Kong GL .High quality hydrogenated amorphous silicon films with significantly improved stability .见:MATERIALS RESEARCH SOCIETY .AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998, 507,506 KEYSTONE DRIVE, WARRENDALE, PA 15088-7563 USA ,1999,969-974 |
Palavras-Chave | #半导体材料 #A-SI-H #LIGHT SOAKING #PHOTOCONDUCTIVITY #INCREASE |
Tipo |
会议论文 |