Analysis of equilateral triangle semiconductor microlasers with rough sidewalls


Autoria(s): Huang YZ; Gun WH; Yu LJ; Lei HB
Data(s)

2001

Resumo

The mode frequencies and quality factors are calculated for the equilateral triangle semiconductor microlasers with sinusoidal and random Gaussian sidewalls. The results show that the modes can still have high Q-factors.

The mode frequencies and quality factors are calculated for the equilateral triangle semiconductor microlasers with sinusoidal and random Gaussian sidewalls. The results show that the modes can still have high Q-factors.

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Japan Soc Appl Phys.; IEICE Elect Soc.; IEICE Commun Soc.; IEEE Lasers & Electro Opt Soc.; Opt Soc Amer.; Optoelect Ind & Technol Dev Assoc.

Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China

Japan Soc Appl Phys.; IEICE Elect Soc.; IEICE Commun Soc.; IEEE Lasers & Electro Opt Soc.; Opt Soc Amer.; Optoelect Ind & Technol Dev Assoc.

Identificador

http://ir.semi.ac.cn/handle/172111/13637

http://www.irgrid.ac.cn/handle/1471x/105000

Idioma(s)

英语

Publicador

IEEE

345 E 47TH ST, NEW YORK, NY 10017 USA

Fonte

Huang YZ; Gun WH; Yu LJ; Lei HB .Analysis of equilateral triangle semiconductor microlasers with rough sidewalls .见:IEEE .CLEO(R)/PACIFIC RIM 2001, VOL II, TECHNICAL DIGEST,345 E 47TH ST, NEW YORK, NY 10017 USA ,2001,612-613

Palavras-Chave #光电子学 #LASERS
Tipo

会议论文