Microstructure of the silicon film prepared near the phase transition regime from amorphous to nanocrystalline


Autoria(s): Zhang SB; Liao XB; Xu YY; Hu ZH; Zeng XB; Diao HW; Luo MC; Kong G
Data(s)

2003

Resumo

A kind of hydrogenated diphasic silicon films has been prepared by a new regime of plasma enhanced chemical vapor deposition (PECVD) near the phase transition regime from amorphous to nanocrystalline. The microstructural properties of the films have been investigated by the micro-Raman and Fourier transformed Infrared (FT-IR) spectra and atom force microscopy (AFM). The obtained Raman spectra show not only the existence of nanoscaled crystallites, but also a notable improvement in the medium-range order of the diphasic films. For the FT-IR spectra of this kind of films, it notes that there is a blueshift in the Si-H stretching mode and a redshift in the Si-H wagging mode in respect to that of typical amorphous silicon film. We discussed the reasons responsible for these phenomena by means of the phase transition, which lead to the formation of a diatomic hydrogen complex, H-2* and their congeries.

A kind of hydrogenated diphasic silicon films has been prepared by a new regime of plasma enhanced chemical vapor deposition (PECVD) near the phase transition regime from amorphous to nanocrystalline. The microstructural properties of the films have been investigated by the micro-Raman and Fourier transformed Infrared (FT-IR) spectra and atom force microscopy (AFM). The obtained Raman spectra show not only the existence of nanoscaled crystallites, but also a notable improvement in the medium-range order of the diphasic films. For the FT-IR spectra of this kind of films, it notes that there is a blueshift in the Si-H stretching mode and a redshift in the Si-H wagging mode in respect to that of typical amorphous silicon film. We discussed the reasons responsible for these phenomena by means of the phase transition, which lead to the formation of a diatomic hydrogen complex, H-2* and their congeries.

于2010-10-29批量导入

Made available in DSpace on 2010-10-29T06:36:27Z (GMT). No. of bitstreams: 1 2801.pdf: 95976 bytes, checksum: fef181dc99bed5361f4cad17a75265c3 (MD5) Previous issue date: 2003

Mat Res Soc.; Evident Technol Inc.; IBM TJ Watson Res Ctr.; Los Alamos Natl Lab.; Motorola Inc.; Texas A&M Univ.

Chinese Acad Sci, Inst Semicond, Ctr Condensed State Phys, State Key Lab Surface Phys, Beijing 100083, Peoples R China

Mat Res Soc.; Evident Technol Inc.; IBM TJ Watson Res Ctr.; Los Alamos Natl Lab.; Motorola Inc.; Texas A&M Univ.

Identificador

http://ir.semi.ac.cn/handle/172111/13623

http://www.irgrid.ac.cn/handle/1471x/104993

Idioma(s)

英语

Publicador

MATERIALS RESEARCH SOCIETY

506 KEYSTONE DRIVE, WARRENDALE, PA 15088-7563 USA

Fonte

Zhang SB; Liao XB; Xu YY; Hu ZH; Zeng XB; Diao HW; Luo MC; Kong G .Microstructure of the silicon film prepared near the phase transition regime from amorphous to nanocrystalline .见:MATERIALS RESEARCH SOCIETY .QUANTUM CONFINED SEMICONDUCTOR NANOSTRUCTURES, 737,506 KEYSTONE DRIVE, WARRENDALE, PA 15088-7563 USA ,2003,679-684

Palavras-Chave #半导体材料 #POLYMORPHOUS SILICON #LIGHT-SCATTERING #THIN-FILMS #SI #MICROCRYSTALLINITY #ABSORPTION #STATES
Tipo

会议论文