Choice of calibration equations of the TSM method

For the reciprocal-test fixtures, there are six independent S-parameters to. be determined, and the thru-short-match (TSM) calibration can provide eight calibration equations. In this paper, the relation of calibration equations is investigated. It has been shown that the four equations obtained from the measurement with a transmission standard can be used simultaneously in the calibration. Experimental results show that the different choice of equations will lead to quite different solution, and the calibration accuracy can be improved by taking advantages of the established relation among the calibration equations and properly choosing calibration equations.

For the reciprocal-test fixtures, there are six independent S-parameters to. be determined, and the thru-short-match (TSM) calibration can provide eight calibration equations. In this paper, the relation of calibration equations is investigated. It has been shown that the four equations obtained from the measurement with a transmission standard can be used simultaneously in the calibration. Experimental results show that the different choice of equations will lead to quite different solution, and the calibration accuracy can be improved by taking advantages of the established relation among the calibration equations and properly choosing calibration equations.

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Chinese Inst Electr.; IEEE Microwave Theory & Techn Soc.; IEEE Electron Devices Soc.; IEE Antennas & Propagat Soc.; Electr Soc, Inst Electr, Informat & Commun Engineers Japan.; Korea Inst Telemat & Electr.; IEEE Beijing Sect.; IEE Beijing Ctr.; IEEE MTT S Beijing Chapter.

CAS, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China

Chinese Inst Electr.; IEEE Microwave Theory & Techn Soc.; IEEE Electron Devices Soc.; IEE Antennas & Propagat Soc.; Electr Soc, Inst Electr, Informat & Commun Engineers Japan.; Korea Inst Telemat & Electr.; IEEE Beijing Sect.; IEE Beijing Ctr.; IEEE MTT S Beijing Chapter.