Two-port calibration of test fixtures with OSL method.
Data(s) |
2002
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Resumo |
The open-short-load (OSL) method is very simple and widely used, for one-port test fixture calibration. In this paper, this method. is extended to the two-port calibration of test fixtures for the first time. The problem of phase uncertainty arising in this application has been solved. The comparison between our results and those obtained with the short-open-load-thru (SOLT) method shows that the method established is accurate enough for practical applications. The open-short-load (OSL) method is very simple and widely used, for one-port test fixture calibration. In this paper, this method. is extended to the two-port calibration of test fixtures for the first time. The problem of phase uncertainty arising in this application has been solved. The comparison between our results and those obtained with the short-open-load-thru (SOLT) method shows that the method established is accurate enough for practical applications. 于2010-10-29批量导入 Made available in DSpace on 2010-10-29T06:36:25Z (GMT). No. of bitstreams: 1 2793.pdf: 217670 bytes, checksum: 2d582a13ed488ca5a6b0f11a7ba11583 (MD5) Previous issue date: 2002 Chinese Inst Electr.; IEEE Microwave Theory & Techn Soc.; IEEE Electron Devices Soc.; IEE Antennas & Propagat Soc.; Electr Soc, Inst Electr, Informat & Commun Engineers Japan.; Korea Inst Telemat & Electr.; IEEE Beijing Sect.; IEE Beijing Ctr.; IEEE MTT S Beijing Chapter. CAS, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China Chinese Inst Electr.; IEEE Microwave Theory & Techn Soc.; IEEE Electron Devices Soc.; IEE Antennas & Propagat Soc.; Electr Soc, Inst Electr, Informat & Commun Engineers Japan.; Korea Inst Telemat & Electr.; IEEE Beijing Sect.; IEE Beijing Ctr.; IEEE MTT S Beijing Chapter. |
Identificador | |
Idioma(s) |
英语 |
Publicador |
IEEE 345 E 47TH ST, NEW YORK, NY 10017 USA |
Fonte |
Chen ZY; Wang YL; Liu Y; Zhu NH .Two-port calibration of test fixtures with OSL method. .见:IEEE .2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS,345 E 47TH ST, NEW YORK, NY 10017 USA ,2002,138-141 |
Palavras-Chave | #光电子学 #calibration #microwave network analyzer #scattering-parameter measurement #phase uncertainty #NETWORK-ANALYZER CALIBRATION #LINE |
Tipo |
会议论文 |