Reduction in crystallographic tilt of lateral epitaxial overgrown GaN by using new patterned shape mask


Autoria(s): Feng G; Shen XM; Zhu JJ; Zhang BS; Yang H; Liang JW
Data(s)

2003

Resumo

We proposed a new method to suppress the crystallographic tilt in the lateral epitaxial overgrowth of GaN by using an oxide mask with a newly designed pattern. A rhombus mask with edges oriented in the direction of <10 - 10>(GaN) was used instead of the traditional stripe mask. The morphology evolution during the LEO GaN with the rhombus mask was investigated by SEM, and the crystallographic tilt in the LEO GaN was measured by DC-XRD. It is found that using the new rhombus mask can decrease the crystallographic tilt in the LEO GaN. In addition, this method makes the ELO GaN stripes easy to coalesce. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

We proposed a new method to suppress the crystallographic tilt in the lateral epitaxial overgrowth of GaN by using an oxide mask with a newly designed pattern. A rhombus mask with edges oriented in the direction of <10 - 10>(GaN) was used instead of the traditional stripe mask. The morphology evolution during the LEO GaN with the rhombus mask was investigated by SEM, and the crystallographic tilt in the LEO GaN was measured by DC-XRD. It is found that using the new rhombus mask can decrease the crystallographic tilt in the LEO GaN. In addition, this method makes the ELO GaN stripes easy to coalesce. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

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Japan Soc Appl Phys.; Japan Soc Promot Sci, 162nd Comm Wide Bandgap Semiconductor Photon & Elect Devices.; Japan Assoc Crystal Growth.; Elect Soc.

Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China

Japan Soc Appl Phys.; Japan Soc Promot Sci, 162nd Comm Wide Bandgap Semiconductor Photon & Elect Devices.; Japan Assoc Crystal Growth.; Elect Soc.

Identificador

http://ir.semi.ac.cn/handle/172111/13563

http://www.irgrid.ac.cn/handle/1471x/104963

Idioma(s)

英语

Publicador

WILEY-VCH, INC

605 THIRD AVE, NEW YORK, NY 10158-0012 USA

Fonte

Feng G; Shen XM; Zhu JJ; Zhang BS; Yang H; Liang JW .Reduction in crystallographic tilt of lateral epitaxial overgrown GaN by using new patterned shape mask .见:WILEY-VCH, INC .5TH INTERNATIONAL CONFERENCE ON NITRIDE SEMICONDUCTORS (ICNS-5), PROCEEDINGS,605 THIRD AVE, NEW YORK, NY 10158-0012 USA ,2003,2167-2170

Palavras-Chave #光电子学 #BUFFER LAYER #SUBSTRATE #DIODES #GROWTH
Tipo

会议论文