Reduction in crystallographic tilt of lateral epitaxial overgrown GaN by using new patterned shape mask
Data(s) |
2003
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Resumo |
We proposed a new method to suppress the crystallographic tilt in the lateral epitaxial overgrowth of GaN by using an oxide mask with a newly designed pattern. A rhombus mask with edges oriented in the direction of <10 - 10>(GaN) was used instead of the traditional stripe mask. The morphology evolution during the LEO GaN with the rhombus mask was investigated by SEM, and the crystallographic tilt in the LEO GaN was measured by DC-XRD. It is found that using the new rhombus mask can decrease the crystallographic tilt in the LEO GaN. In addition, this method makes the ELO GaN stripes easy to coalesce. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. We proposed a new method to suppress the crystallographic tilt in the lateral epitaxial overgrowth of GaN by using an oxide mask with a newly designed pattern. A rhombus mask with edges oriented in the direction of <10 - 10>(GaN) was used instead of the traditional stripe mask. The morphology evolution during the LEO GaN with the rhombus mask was investigated by SEM, and the crystallographic tilt in the LEO GaN was measured by DC-XRD. It is found that using the new rhombus mask can decrease the crystallographic tilt in the LEO GaN. In addition, this method makes the ELO GaN stripes easy to coalesce. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. 于2010-10-29批量导入 Made available in DSpace on 2010-10-29T06:36:15Z (GMT). No. of bitstreams: 1 2765.pdf: 95051 bytes, checksum: e9c422f61fae3be45ba9098ca09415e2 (MD5) Previous issue date: 2003 Japan Soc Appl Phys.; Japan Soc Promot Sci, 162nd Comm Wide Bandgap Semiconductor Photon & Elect Devices.; Japan Assoc Crystal Growth.; Elect Soc. Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China Japan Soc Appl Phys.; Japan Soc Promot Sci, 162nd Comm Wide Bandgap Semiconductor Photon & Elect Devices.; Japan Assoc Crystal Growth.; Elect Soc. |
Identificador | |
Idioma(s) |
英语 |
Publicador |
WILEY-VCH, INC 605 THIRD AVE, NEW YORK, NY 10158-0012 USA |
Fonte |
Feng G; Shen XM; Zhu JJ; Zhang BS; Yang H; Liang JW .Reduction in crystallographic tilt of lateral epitaxial overgrown GaN by using new patterned shape mask .见:WILEY-VCH, INC .5TH INTERNATIONAL CONFERENCE ON NITRIDE SEMICONDUCTORS (ICNS-5), PROCEEDINGS,605 THIRD AVE, NEW YORK, NY 10158-0012 USA ,2003,2167-2170 |
Palavras-Chave | #光电子学 #BUFFER LAYER #SUBSTRATE #DIODES #GROWTH |
Tipo |
会议论文 |