Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry


Autoria(s): 马文全; 王玉田; 庄岩; 江德生; 朱洪亮; 张静媛; 段俐宏; 王圩
Data(s)

1998

Identificador

http://ir.semi.ac.cn/handle/172111/19213

http://www.irgrid.ac.cn/handle/1471x/104244

Idioma(s)

中文

Fonte

马文全;王玉田;庄岩;江德生;朱洪亮;张静媛;段俐宏;王圩.Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry,半导体学报,1998,19(1):61

Palavras-Chave #光电子学
Tipo

期刊论文