In_(0.49)Ga_(0.51)P中缺陷的俘获行为


Autoria(s): 王海龙; 封松林
Data(s)

1999

Resumo

于2010-11-23批量导入

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中科院半导体所

Identificador

http://ir.semi.ac.cn/handle/172111/18541

http://www.irgrid.ac.cn/handle/1471x/103908

Idioma(s)

中文

Fonte

王海龙;封松林.In_(0.49)Ga_(0.51)P中缺陷的俘获行为,发光学报,1999,20(1):17

Palavras-Chave #半导体材料
Tipo

期刊论文