用X射线双晶衍射方法测定GaMnAs组分
| Data(s) |
2001
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| Resumo |
于2010-11-23批量导入 zhangdi于2010-11-23 13:09:07导入数据到SEMI-IR的IR Made available in DSpace on 2010-11-23T05:09:07Z (GMT). No. of bitstreams: 1 5193.pdf: 290650 bytes, checksum: 0bfae950793b5c50ac06685cec02e53c (MD5) Previous issue date: 2001-24 中科院半导体所 |
| Identificador | |
| Idioma(s) |
中文 |
| Fonte |
陈诺夫;修慧欣;杨君玲;吴金良;钟兴儒;林兰英.用X射线双晶衍射方法测定GaMnAs组分,科学通报,2001(24,2035(0): |
| Palavras-Chave | #半导体材料 |
| Tipo |
期刊论文 |
