An Improved Driving Circuit for Thermo-Optical Switch to Improve the Reliability of Thermo-Optical Switch Matrix
Data(s) |
2005
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Resumo |
The influence of the heaters on the reliability of the thermo-optic (TO) switch matrix is analyzed and an improved driving circuit based on the analyzed results is designed and fabricated. The circuit can improve the reliability of the switch matrix device from 78.87% to 97.04% for a 4×4 optical switch device with a simplified tree structure. The simulation and experimental results show the circuit can provide suitable driving current for TO switch matrix. The influence of the heaters on the reliability of the thermo-optic (TO) switch matrix is analyzed and an improved driving circuit based on the analyzed results is designed and fabricated. The circuit can improve the reliability of the switch matrix device from 78.87% to 97.04% for a 4×4 optical switch device with a simplified tree structure. The simulation and experimental results show the circuit can provide suitable driving current for TO switch matrix. 于2010-11-23批量导入 zhangdi于2010-11-23 13:05:24导入数据到SEMI-IR的IR Made available in DSpace on 2010-11-23T05:05:24Z (GMT). No. of bitstreams: 1 4591.pdf: 172942 bytes, checksum: 4882e7f424a2f9a0f0b40042443fc287 (MD5) Previous issue date: 2005 国家自然科学基金重大基金项目,973项目,863项目 Institute of Semiconductors,Chinese Academy of Sciences 国家自然科学基金重大基金项目,973项目,863项目 |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Li Yuntao;Chen Shaowu;Yu Jinzhong.An Improved Driving Circuit for Thermo-Optical Switch to Improve the Reliability of Thermo-Optical Switch Matrix,电子器件,2005,28(1):158-160 |
Palavras-Chave | #光电子学 |
Tipo |
期刊论文 |