Detection of Terahertz Photon by GaAs-Based Single Electron Transistor at Low Temperatures


Autoria(s): Han Weihua; Yomoto M; Kasai S
Data(s)

2007

Resumo

A reproducible terahertz (THz) photocurrent was observed at low temperatures in a Schottky wrap gate single electron transistor with a normal-incident of a CH_3OH gas laser with the frequency 2. 54THz.The change of source-drain current induced by THz photons shows that a satellite peak is generated beside the resonance peak. THz photon energy can be characterized by the difference of gate voltage positions between the resonance peak and satellite peak. This indicates that the satellite peak exactly results from the THz photon-assisted tunneling. Both experimental results and theoretical analysis show that a narrow spacing of double barriers is more effective for the enhancement of THz response.

A reproducible terahertz (THz) photocurrent was observed at low temperatures in a Schottky wrap gate single electron transistor with a normal-incident of a CH_3OH gas laser with the frequency 2. 54THz.The change of source-drain current induced by THz photons shows that a satellite peak is generated beside the resonance peak. THz photon energy can be characterized by the difference of gate voltage positions between the resonance peak and satellite peak. This indicates that the satellite peak exactly results from the THz photon-assisted tunneling. Both experimental results and theoretical analysis show that a narrow spacing of double barriers is more effective for the enhancement of THz response.

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国家自然科学基金资助项目

Research Center of Engineering for Semiconductor Integrated Technology,Institute of Semiconductors, Chinese Academy of Sciences;Research Center for Integrated Quantum Electronics, Hokkaido University

国家自然科学基金资助项目

Identificador

http://ir.semi.ac.cn/handle/172111/16319

http://www.irgrid.ac.cn/handle/1471x/102198

Idioma(s)

英语

Fonte

Han Weihua;Yomoto M;Kasai S.Detection of Terahertz Photon by GaAs-Based Single Electron Transistor at Low Temperatures,半导体学报,2007,28(4):500-506

Palavras-Chave #微电子学
Tipo

期刊论文