Wet etching and infrared absorption of AlN bulk single crystals


Autoria(s): Li Weiwei; Zhao Youwen; Dong Zhiyuan; Yang Jun; Hu Weijie; Ke Jianhong
Data(s)

2009

Resumo

The defects and the lattice perfection of an AlN (0001) single crystal grown by the physical vapor transport (PVT) method were investigated by wet etching, X-ray diffraction (XRD), and infrared absorption, respectively. A regular hexagonal etch pit density (EPD) of about 4000 cm~(-2) is observed on the (0001) A1 surface of an AlN single crystal. The EPD exhibits a line array along the slip direction of the wurtzite structure, indicating a quite large thermal stress born by the crystal in the growth process. The XRD full width at half maximum (FWHM) of the single crystal is 35 arcsec, suggesting a good lattice perfection. Pronounced infrared absorption peaks are observed at wave numbers of 1790, 1850, 2000, and 3000 cm~(-1), respectively. These absorptions might relate to impurities O, C, Si and their complexes in AlN single crystals.

The defects and the lattice perfection of an AlN (0001) single crystal grown by the physical vapor transport (PVT) method were investigated by wet etching, X-ray diffraction (XRD), and infrared absorption, respectively. A regular hexagonal etch pit density (EPD) of about 4000 cm~(-2) is observed on the (0001) A1 surface of an AlN single crystal. The EPD exhibits a line array along the slip direction of the wurtzite structure, indicating a quite large thermal stress born by the crystal in the growth process. The XRD full width at half maximum (FWHM) of the single crystal is 35 arcsec, suggesting a good lattice perfection. Pronounced infrared absorption peaks are observed at wave numbers of 1790, 1850, 2000, and 3000 cm~(-1), respectively. These absorptions might relate to impurities O, C, Si and their complexes in AlN single crystals.

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Institute of Semiconductors, Chinese Academy of Sciences

Identificador

http://ir.semi.ac.cn/handle/172111/15739

http://www.irgrid.ac.cn/handle/1471x/101908

Idioma(s)

英语

Fonte

Li Weiwei;Zhao Youwen;Dong Zhiyuan;Yang Jun;Hu Weijie;Ke Jianhong.Wet etching and infrared absorption of AlN bulk single crystals,半导体学报,2009,30(7):27-30

Palavras-Chave #半导体材料
Tipo

期刊论文