Electron migration in BaFCl:Eu2+ phosphors
Data(s) |
1997
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Resumo |
Here we report the electron migration by photo- or thermostimulation in BaFCl:Eu2+. Electrons released from F centers may be trapped by other defect sites to form F aggregates or another type of F center and vice versa. This migration reduces the photostimulated luminescence efficiency, lowers the imaging plate sensitivity, and causes the difference between the optical absorption and photostimulation spectra of color centers. (C) 1997 American Institute of Physics. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Chen W; Song QQ; Su MZ .Electron migration in BaFCl:Eu2+ phosphors ,JOURNAL OF APPLIED PHYSICS,1997,81(7):3170-3174 |
Palavras-Chave | #光电子学 #HOLE-PHOTOSTIMULATED LUMINESCENCE #STORAGE PHOSPHOR #COLOR-CENTERS #V-CENTERS #BAFBR-EU-2+ #BAFBR #RADIATION #CRYSTALS |
Tipo |
期刊论文 |