Electron migration in BaFCl:Eu2+ phosphors


Autoria(s): Chen W; Song QQ; Su MZ
Data(s)

1997

Resumo

Here we report the electron migration by photo- or thermostimulation in BaFCl:Eu2+. Electrons released from F centers may be trapped by other defect sites to form F aggregates or another type of F center and vice versa. This migration reduces the photostimulated luminescence efficiency, lowers the imaging plate sensitivity, and causes the difference between the optical absorption and photostimulation spectra of color centers. (C) 1997 American Institute of Physics.

Identificador

http://ir.semi.ac.cn/handle/172111/15247

http://www.irgrid.ac.cn/handle/1471x/101518

Idioma(s)

英语

Fonte

Chen W; Song QQ; Su MZ .Electron migration in BaFCl:Eu2+ phosphors ,JOURNAL OF APPLIED PHYSICS,1997,81(7):3170-3174

Palavras-Chave #光电子学 #HOLE-PHOTOSTIMULATED LUMINESCENCE #STORAGE PHOSPHOR #COLOR-CENTERS #V-CENTERS #BAFBR-EU-2+ #BAFBR #RADIATION #CRYSTALS
Tipo

期刊论文