Properties of cubic GaN grown by MBE


Autoria(s): Brandt O; Yang H; Mullhauser JR; Trampert A; Ploog KH
Data(s)

1997

Resumo

We review our investigation of cubic GaN films on (001) GaAs, focusing on the structural, optical, and electrical properties of these films. Cubic GaN films grown epitaxially on GaAs suffer from the large lattice mismatch between these two materials in that they contain extremely high densities of structural defects. Surprisingly, the optical quality of these films does not seem much affected by the presence of defects, as intense photoluminescence is detected a? room temperature and above. Finally, the rather high background electron concentrations in our films is shown to be a consequence of contamination with O and not to be an intrinsic property of cubic phase GaN. (C) 1997 Elsevier Science S.A.

Identificador

http://ir.semi.ac.cn/handle/172111/15223

http://www.irgrid.ac.cn/handle/1471x/101506

Idioma(s)

英语

Fonte

Brandt O; Yang H; Mullhauser JR; Trampert A; Ploog KH .Properties of cubic GaN grown by MBE ,MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY ,1997,43(0):215-221

Palavras-Chave #半导体材料 #cubic gallium arsenide film #molecular beam epitaxy #photoluminescence #transmission electron microscopy #MOLECULAR-BEAM EPITAXY #GALLIUM NITRIDE #GAAS
Tipo

期刊论文