Self-formed InGaAs/GaAs quantum dot superlattice and direct observation on strain distribution in the capped superlattice


Autoria(s): Pan D; Zeng YP; Wu J; Wang HM; Chang CH; Li JM; Kong MY
Data(s)

1997

Resumo

We have demonstrated a 20 period dislocation-free InGaAs/GaAs quantum dot superlattice which is self-formed by the strain from the superlattice taken as a whole rather than by the strain from the strained single layer. The island formation does not take place while growing the corresponding strained single layer. From the variation of the average dot height in each layer, the strain distribution and relaxation process in the capped superlattice have been examined. It is found that the strain is not uniformly distributed and the greatest strains occur at two interfaces between the superlattice and the substrate and the cap layer in the capped superlattice. (C) 1997 American Institute of Physics.

Identificador

http://ir.semi.ac.cn/handle/172111/15215

http://www.irgrid.ac.cn/handle/1471x/101502

Idioma(s)

英语

Fonte

Pan D; Zeng YP; Wu J; Wang HM; Chang CH; Li JM; Kong MY .Self-formed InGaAs/GaAs quantum dot superlattice and direct observation on strain distribution in the capped superlattice ,APPLIED PHYSICS LETTERS,1997,70(18):2440-2442

Palavras-Chave #半导体物理 #EPITAXIAL MULTILAYERS #GROWTH #INXGA1-XAS #DISLOCATIONS #STABILITY #DEFECTS #FILMS
Tipo

期刊论文