A STUDY OF NITROGEN ISOELECTRONIC TRAPS IN GAAS


Autoria(s): ZHAO XS; LI GH; HAN HX; WANG ZP; TANG RM; CHE RZ
Data(s)

1985

Identificador

http://ir.semi.ac.cn/handle/172111/14725

http://www.irgrid.ac.cn/handle/1471x/101397

Idioma(s)

英语

Fonte

ZHAO XS; LI GH; HAN HX; WANG ZP; TANG RM; CHE RZ.A STUDY OF NITROGEN ISOELECTRONIC TRAPS IN GAAS,CHINESE PHYSICS,1985,5(2):337-340

Palavras-Chave #半导体物理
Tipo

期刊论文