DETERMINATION OF QUASI-FERMI LEVEL WITHIN SCHOTTKY-BARRIER FROM ITS IV CHARACTERISTICS


Autoria(s): GE WK
Data(s)

1986

Identificador

http://ir.semi.ac.cn/handle/172111/14695

http://www.irgrid.ac.cn/handle/1471x/101382

Idioma(s)

英语

Fonte

GE WK.DETERMINATION OF QUASI-FERMI LEVEL WITHIN SCHOTTKY-BARRIER FROM ITS IV CHARACTERISTICS,CHINESE PHYSICS ,1986,6(2):513-515

Palavras-Chave #半导体物理
Tipo

期刊论文