CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF SILICON LSI CIRCUITS AND JOSEPHSON JUNCTION DEVICES

Autoria(s): DU AY; CHU YM
Data(s)

1987
Identificador

http://ir.semi.ac.cn/handle/172111/14623

http://www.irgrid.ac.cn/handle/1471x/101346
Idioma(s)

英语
Fonte

DU AY; CHU YM.CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF SILICON LSI CIRCUITS AND JOSEPHSON JUNCTION DEVICES,JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE,1987,7(4):319-322
Palavras-Chave #半导体器件
Tipo

期刊论文
Acesso ao item digital