PHOTOREFLECTANCE STUDY OF NARROW-WELL STRAINED-LAYER INXGA1-XAS/GAAS COUPLED MULTIPLE-QUANTUM-WELL STRUCTURES

Autoria(s): PAN SH; SHEN H; HANG Z; POLLAK FH; ZHUANG WH; XU Q; ROTH AP; MASUT RA; LACELLE C; MORRIS D
Data(s)

1988
Identificador

http://ir.semi.ac.cn/handle/172111/14563

http://www.irgrid.ac.cn/handle/1471x/101316
Idioma(s)

英语
Fonte

PAN SH; SHEN H; HANG Z; POLLAK FH; ZHUANG WH; XU Q; ROTH AP; MASUT RA; LACELLE C; MORRIS D.PHOTOREFLECTANCE STUDY OF NARROW-WELL STRAINED-LAYER INXGA1-XAS/GAAS COUPLED MULTIPLE-QUANTUM-WELL STRUCTURES,PHYSICAL REVIEW B,1988,38(5):3375-3382
Palavras-Chave #半导体物理
Tipo

期刊论文
Acesso ao item digital