STUDY OF THE QUALITY OF GAAS THIN-FILM ON SI SUBSTRATE BY X-RAY-DIFFRACTION METHOD
| Data(s) |
1990
|
|---|---|
| Identificador | |
| Idioma(s) |
英语 |
| Fonte |
LI CR; MAI ZH; CUI SF; ZHOU JM; WANG YT.STUDY OF THE QUALITY OF GAAS THIN-FILM ON SI SUBSTRATE BY X-RAY-DIFFRACTION METHOD,CHINESE PHYSICS LETTERS,1990,7(7):308-311 |
| Palavras-Chave | #半导体物理 |
| Tipo |
期刊论文 |
