SPATIAL DISTRIBUTIONS OF IMPURITIES AND DEFECTS IN TE-DOPED AND SI-DOPED GAAS GROWN IN A REDUCED GRAVITY ENVIRONMENT


Autoria(s): WANG ZG; LI CJ; WAN SK; LIN LY
Data(s)

1990

Identificador

http://ir.semi.ac.cn/handle/172111/14365

http://www.irgrid.ac.cn/handle/1471x/101217

Idioma(s)

英语

Fonte

WANG ZG; LI CJ; WAN SK; LIN LY.SPATIAL DISTRIBUTIONS OF IMPURITIES AND DEFECTS IN TE-DOPED AND SI-DOPED GAAS GROWN IN A REDUCED GRAVITY ENVIRONMENT,JOURNAL OF CRYSTAL GROWTH,1990,103(0):38-45

Palavras-Chave #半导体材料
Tipo

期刊论文