INTERFACIAL FORMATION PROCESS AND REACTIONS BETWEEN AU AND HYDROGENATED AMORPHOUS SI STUDIED BY XPS AND AES


Autoria(s): ZHONG ZT; WANG DW; LIAO XB; MOU SM; LI CF; FAN Y
Data(s)

1991

Resumo

Interfacial formation processes and reactions between Au and hydrogenated amorphous Si have been studied by photoemission spectroscopy and Auger electron spectroscopy. A three-dimensional growth of Au metal cluster occurs at initial formation of the Au/a-Si:H interface. When Au deposition exceeds a critical time, Au and Si begin interdiffusing and react to create an Au-Si alloy region. Annealing enhances interdiffusion and a Si-rich region exists on the topmost surface of Au films on a-Si:H.

Identificador

http://ir.semi.ac.cn/handle/172111/14263

http://www.irgrid.ac.cn/handle/1471x/101166

Idioma(s)

英语

Fonte

ZHONG ZT; WANG DW; LIAO XB; MOU SM; LI CF; FAN Y.INTERFACIAL FORMATION PROCESS AND REACTIONS BETWEEN AU AND HYDROGENATED AMORPHOUS SI STUDIED BY XPS AND AES,JOURNAL OF NON-CRYSTALLINE SOLIDS ,1991,134(0):141-146

Palavras-Chave #半导体物理 #SILICON #FILMS #MICROSTRUCTURE #GOLD
Tipo

期刊论文