ON THE DANGLING-BOND RELAXATION PROBLEM IN HYDROGENATED AMORPHOUS-SILICON


Autoria(s): KAZANSKII AG; MAO Y; KONG GL
Data(s)

1994

Resumo

The influence of pulsed bias light excitation on the absorption in the defect region of undoped a-Si:H film has been investigated. Ac constant photocurrent method has been used to measure the absorption spectrum. The absorption in the defect region increases with the light pulse duration.The analysis of obtained results does not support the existence of a long time relaxation process of dangling-bond states in a-Si:H.

Identificador

http://ir.semi.ac.cn/handle/172111/13985

http://www.irgrid.ac.cn/handle/1471x/101027

Idioma(s)

英语

Fonte

KAZANSKII AG; MAO Y; KONG GL.ON THE DANGLING-BOND RELAXATION PROBLEM IN HYDROGENATED AMORPHOUS-SILICON,SOLID STATE COMMUNICATIONS ,1994,91(6):447-449

Palavras-Chave #半导体材料 #A-SI-H
Tipo

期刊论文