Calculation of temperature fields with a film-substrate interfacial layer model to discuss the layer-pair number effects on the damage thresholds of LaF3/MgF2 high reflectors at 355 nm


Autoria(s): Guanghui Liu; Ming Zhou; Guohang Hu; Xiaofeng Liu; Yunxia Jin; Hongbo He; Zhengxiu Fan
Data(s)

2010

Identificador

http://ir.siom.ac.cn/handle/181231/7243

http://www.irgrid.ac.cn/handle/1471x/87062

Idioma(s)

中文

Fonte

Guanghui Liu , Ming Zhou, Guohang Hu, Xiaofeng Liu, Yunxia Jin, Hongbo He, Zhengxiu Fan.Calculation of temperature fields with a film-substrate interfacial layer model to discuss the layer-pair number effects on the damage thresholds of LaF3/MgF2 high reflectors at 355 nm .Applied Surface Science,2010,256:

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Tipo

期刊论文