Mechanical stress in 355 nm LaF3/MgF2 high reflectors with various layer-pair number and methods for reduction


Autoria(s): Guang-hui Liu; Qi-ling Xiao; Yun-xia Jin; Wei-li Zhang; Hong-bo He; Zheng-xiu Fan
Data(s)

2010

Identificador

http://ir.siom.ac.cn/handle/181231/7242

http://www.irgrid.ac.cn/handle/1471x/87061

Idioma(s)

中文

Fonte

Guang-hui Liu, Qi-ling Xiao, Yun-xia Jin, Wei-li Zhang, Hong-bo He, Zheng-xiu Fan.Mechanical stress in 355 nm LaF3/MgF2 high reflectors with various layer-pair number and methods for reduction.Vacuum,2010,84:

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Tipo

期刊论文