Further investigation of the characteristics of nodular defects

Autoria(s): Xiaofeng Liu; Dawei Li; Yuan’an Zhao; Xiao Li
Data(s)

2010
Identificador

http://ir.siom.ac.cn/handle/181231/7188

http://www.irgrid.ac.cn/handle/1471x/87052
Idioma(s)

中文
Fonte

Xiaofeng Liu, Dawei Li,Yuan’an Zhao,Xiao Li.Further investigation of the characteristics of nodular defects.APPLIED OPTICS,2010,4:1774
Palavras-Chave #激光技术
Tipo

期刊论文
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