Changes of optical, dielectric, and structural properties of Si15Sb85 phase change memory thin films under different initializing laser power

Autoria(s): Huang Huan(黄欢); Zhang Lei(张雷); Wang Yang(王阳); Han Xiao Dong(韩晓东); Wu Yiqun(吴谊群); Zhang Ze(张泽); Gan Fuxi(干福熹)
Data(s)

12/02/2011
Identificador

http://ir.siom.ac.cn/handle/181231/7015

http://www.irgrid.ac.cn/handle/1471x/86949
Idioma(s)

中文
Fonte

Huang,Huan,Zhang,Lei,Wang,Yang,Han,Xiao Dong,Wu,Yiqun,Zhang,Ze,Gan,Fuxi.Changes of optical, dielectric, and structural properties of Si15Sb85 phase change memory thin films under different initializing laser power.Journal of Alloys and Compounds,2011,509:5050-5054
Palavras-Chave #光学 #SiSb phase change film
Tipo

期刊论文
Acesso ao item digital